Bộ chuyển đổi IMP-TH45 IMP-TH70 Micro epsilon VietNam, LTD đại lý Micro epsilon

Bộ chuyển đổi IMP-TH45 IMP-TH70 Micro epsilon VietNam, LTD đại lý Micro epsilon

Sensors for thickness measurements interferoMETER 5400-TH

Stable thickness measurement with varying distances

The IMS5400-TH absolute interferometer opens up new perspectives in industrial thickness measurements. The interferometer is used for highly accurate thickness measurements from a relatively large distance. The large thickness measuring range allows the measurement of thin layers, flat glass and films. As the absolute interferometer works with an SLED in the near-infrared range, it is possible to measure the thickness of optically non-dense objects such as anti-reflective coated glass. Reliable even with vibrating materials A decisive advantage is the distance-independent measurement, where a stable nanometer-accurate thickness value is achieved. This is how the target can move within the measuring range without influencing the accuracy.